凯发

Ma Teng, Ph.D., is a Senior Engineer at the National Key Laboratory of Electronic Component Reliability Technology, Institute of Electronics, Ministry of Industry and Information Technology. He has conducted long-term research on radiation effects and failure mechanisms of semiconductor devices and integrated circuits. As the principal investigator, he has led 8 national/provincial-level projects, including those under the National Natural Science Foundation of China and the National Key R&D Program, and jointly participated in 11 projects such as the National Key R&D Program, National Natural Science Foundation, and Guangdong Provincial Automotive Chip Special Program. He was awarded the Second Prize of National Defense Science and Technology Progress. As the first or corresponding author, he has published over 40 SCI/EI papers in international authoritative journals (e.g., APL, IEEE EDL, IEEE TED) and holds more than 10 invention patents. He has participated in the formulation of 1 national standard, 2 industry standards, and 2 group standards. Additionally, he serves as a member of the Standards Committee of the Guizhou Integrated Circuit Society, an editorial board member of the journal *Quality and Reliability*, an external supervisor for master's and doctoral students at Sun Yat-sen University and Shandong University, and a reviewer for multiple academic journals including APL, IEEE TED, NIMA, and MR.