Ping-Heng Tan Institute of Semiconductors, CAS
Tan Ping-Heng holds a PhD degree in condensed matter physics, and is currently Director assistant and Professor at Institute of Semiconductors, Chinese Academy of Sciences. He had awarded National One-hundred Excellent Doctoral Dissertations Awards in 2003, Lu JiaXi Awards for excellent young scientists in 2008, Kun Huang Physics prize in 2015. He was a KC-Wong Royal Society Fellow at Cambridge University from 2006–2007. He was supported by National Science Fund for Distinguished Young Scholars in 2012.
His current research is on two-dimensional layered materials, nanocarbon materials, topological insulators and novel low-dimensional semiconductor optoelectronic materials. Particularly, he devotes himself to the layer-number dependent physical properties of two-dimensional layered materials. His proposed document on “Layer-number determination of multilayer graphenes by Raman spectroscopy” has been set up as one of the projects for national standards on graphene materials.
Title:Determining the layer number of multilayer graphene by Raman spectroscopy
SymposiumY Advanced Test Technology Forum
Starting Time
Ending Time
Abstract
Raman spectroscopy is one of the most used characterization techniques in carbon science and technology. The Raman spectrum of graphite and multilayer graphene (MLG) consists of two fundamentally different sets of peaks. Those, such as D, G and 2D, present also in single-layer graphene (SLG), belong to in-plane vibrations, and others, such as the shear (C) modes and the layer breathing (LB) modes, due to the relative motions of the planes themselves, either perpendicular or parallel to their normal. In NLG, all vibrational modes split due to the confinement in the direction perpendicular to the basal plane, z, and, for a given N, there are N-1 C or LB modes. Here, we will provide a brief discuss on how to determine the layer number of multilayer graphene by Raman spectroscopy via Raman modes from MLG and substrate.