Le Su is a Raman application engineerat Thermo Fisher Scientific Co., Ltd. He holds a PhD degree in AnalyticalChemistry. His major interested areas include Raman applications in materialscience such as carbon materials, biomaterials, battery materials, polymermaterials and pharmaceutical materials.
The applicationpotential of graphene is currently being extensively explored by the materialsscience community. Its immediate potential as a transparent conductiveelectrode for the microelectronics industry is already being exploited and itis speculated that the unique combination ofelectronic, chemical and structural properties exhibited by graphene will impactthe development of thin film transistor development. Further applicationsfor the development of graphene based molecular sensors are underway. Inall stages of application development there is a requirement for materials characterizationand analysis; from the initial research stages, through to testing of thefinished devices. Most materials need to be analyzed for compositionalhomogeneity across the sample surface and thickness. In addition tocompositional analysis, it may be important to characterize the material’selectronic and mechanical properties as well. It is rare that a singletechnique can achieve these testing requirements, and therefore a complementaryapproach involving several techniques is often required.
In this presentation we will discuss how a multi-technique approachusing Raman spectroscopy, AFM/Raman and X-ray photoelectron spectroscopy canaddress the problems associated with the analysis of Graphene materials. Ramanmicroscopy is a vibrational technique that that is very sensitive to smallchanges in a molecule’s geometric structure and its environment. Thissensitivity allows Raman to be used as a probe for a number of propertiesimportant to a specific graphene sample. These properties include, but are notlimited to, the determination of layer thickness, the presence or absence ofdefects and for measuring local strain on a sample. AFM provides a probe intographene’s electronic and mechanical properties and when integrated with Ramaninstrumentation can supply simultaneously molecular information. XPSenables chemical modification of the graphene to be measured, and the chemicalinteraction between the film and the substrate to be investigated. Thisapproach will be illustrated by example analyses from graphene produced byexfoliation and CVD methods.
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E-mail: meeting@c-gia.org
Abstract: Minyang Lu
Sponsor: Wenyang Yang
Media: Liping Wang
Operated by:China Innovation Alliance of the Graphene Industry