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Speaker-Raul Arenal

Raul Arenal
Research scientist,University of Saragossa

Dr. Raul Arenal received his M.S. degree in Materials Science from the University of Joseph Fourier (Grenoble, France) in 2001. He received his Ph.D. in Solid State Physics from Univ. Paris-Sud (Orsay, France, 2005) and in 2013, he obtained his Habilitation (HDR) also atthis University. Since April 2005 to August 2007, he joined the Electron Microscopy Center in Argonne National Laboratory (ANL, USA) as post doctoralfellow. In 2007, he became research scientist (Chargé de Recherches) at the CNRS (France), working at the LEM, CNRS-ONERA (Chatillon, France). From September 2010 to December 2011, he was visiting scientist (sabbatical position) at the Laboratorio de Microscopias Avanzadas (LMA) at the Institutode Nanociencia de Aragon (INA) of the Universidad de Zaragoza (Spain). Since 2012, Dr. Arenal is on leave from the CNRS, and he is currently ARAID research scientist at the LMA-INA-Universidad de Zaragoza. In addition, since 2007 he is visiting researcher at the ANL (USA). He has published more than 170 peer-reviewed contributions (H=25). His broad area of research interest lies in electron microscopy focused on materials science and nano science: TEM (EELS, HR(S) TEM,electron diffraction, electron tomography). These studies are mainly focused on the growth mechanism, structural and physical (electronic, optical,vibrational, mechanical) properties of nanomaterials based on carbon, boron and nitrogen as well as other nano-structures (in particular, different 2D-materials other than graphene and metallic nano-objects for plasmonic/photonic interest). Among his scientific activities, Dr. Arenal is the promoter and chair of Hetero Nano Carb conference series (http://heteronanocarb.org) conferences focused on graphene, NT and related 1D-2D nano materials.

 


Title:Advanced TEM Studies on Different Atomically thin 2D Materials
SymposiumAdvanced Testing Technology
Starting Time
Ending Time
Abstract

The recent advances in transmission electron microscopes (TEM) bring access to electron probes of one angstrom within energy resolutions of ~ 100 meV (even few tens of meV) even working at low acceleration voltages (60-80 kV) [1]. These performances offer new possibilities for probing the optical, dielectric and electronic properties of nanomaterials with unprecedented spatial information, as well as for studying the atomic configuration of nanostructures [1-3]. In this contribution, I will present a selection of recent works involving all these matters. These works will concern the study of the atomic structure & configuration of 2D atomically thin materials (including dichalcogeneides in pristine and hybrid forms) as well as the opto electronic properties studies carried out via EELS measurements, see Fig. 1 [4-8]. These works will illustrate the excellent capabilities offered by the use of a Cs probe corrected STEM, combined with the use of a monochromator, to study these properties within a very good spatial resolution.

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E-mail: meeting@c-gia.org

Abstract: Minyang Lu

Sponsor: Wenyang Yang

Media: Liping Wang

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