凯发

Speaker-Andrew J. Pollard

Andrew J. Pollard
National Physical Laboratory, UK

Current interests
Metrology of graphene and graphene nanodevices
Characterisation of graphene and advanced 2-D materials
International standardisation of graphene and 2-D materials
International standardisation of graphene and 2-D materials
Biography
Andrew Pollard received his MSci in Physics from the University of Nottingham in 2005 and finished his PhD with Professor Peter Beton from the University of Nottingham's Nanoscience group in 2010. Andrew's previous work includes development of a combined AFM-STM system in UHV, production of graphene monolayers on transition metal surfaces in UHV and subsequent STM surface studies.
After joining NPL in 2009, Andrew is now leading the Surface and Nanoanalysis Group's research into the measurement of graphene, other graphene-like advanced 2-D materials, and associated devices. This metrology research focuses on the actual measurement of the materials with a range of surface characterisation techniques, such as Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), scanning probe microscopies (SPM), secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS) and ellipsometry. Andrew is also engaged with organisations in the emerging graphene industry, advising on aspects of standards and measurement in this area, and is on the advisory board of the Graphene Stakeholders Association (GSA).

Title:Metrology for Graphene: Characterisation and Standardisation for an Emerging Industry
SymposiumE Graphene Standardization
Starting Time2015-10-28 09:25:00
Ending Time2015-10-28 09:45:00
Abstract

Graphene has already demonstrated that is can be used to the benefit of metrology as a new quantum standard for resistance [1]. However, there are many application areas where graphene and other 2-D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage [2]. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2-D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.

As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. Examples of metrology challenges that have been overcome using both established and emerging measurement techniques will be discussed, highlighting the cross-disciplinary research and collaboration with both academia and industry.Particularly, the characterisation of the structural and chemical properties of graphene and related 2-D materials via techniques such as Raman spectroscopy, tip-enhanced Raman spectroscopy (TERS) and secondary ion mass spectrometry (SIMS) will be detailed. In addition, how these metrology investigations ultimately lead to the development of international graphene standards will also be described.

Main Organizer

CGIA supports members to focus on application and industry chain, to keep pace with market development, to guarantee industry interests by involving in policy making and establishing standards, and to build long-term cooperation with up-down stream enterprises all over the world.

Contact
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E-mail: meeting@c-gia.org

Abstract: Minyang Lu

Sponsor: Wenyang Yang

Media: Liping Wang

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